Metrology needs and NIST resources for the forensic DNA community

Michael D. Coble, Margaret C. Kline, John M. Butler

Research output: Contribution to journalReview article

1 Citation (Scopus)

Abstract

With the advent of forensic DNA profiling in the mid-1980s, this technology has had a positive impact on the criminal justice system, helping to convict the guilty and exonerate the innocent. The field has evolved from focusing on multilocus markers throughout the nuclear DNA genome to the use of autosomal short tandem repeat (STR) markers. Other marker systems such as mitochondrial DNA and Y-chromosomal STR testing have also found an important niche for the identification of missing persons and historical investigations. Given the importance of forensic DNA testing, it is critical that laboratories include proper controls and validated procedures for making quality measurements. In the United States, the National Institute of Standards and Technology (NIST) developed several standard reference materials (SRMs) to meet the needs of the forensic DNA community. Here, we discuss a brief history of forensic DNA testing and the development of NIST SRMs and educational resources for the field over the last 20 years.

Original languageEnglish
Pages (from-to)293-297
Number of pages5
JournalAccreditation and Quality Assurance
Volume16
Issue number6
DOIs
StatePublished - 1 Jun 2011

Fingerprint

metrology
resources
DNA
deoxyribonucleic acid
markers
Microsatellite Repeats
Testing
educational resources
Mitochondrial DNA
genome
Genes
histories

Keywords

  • DNA quantification
  • Forensic DNA testing
  • National Institute of Standards and Technology (USA)
  • STRBase
  • Short tandem repeat
  • Standard reference materials

Cite this

Coble, Michael D. ; Kline, Margaret C. ; Butler, John M. / Metrology needs and NIST resources for the forensic DNA community. In: Accreditation and Quality Assurance. 2011 ; Vol. 16, No. 6. pp. 293-297.
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Metrology needs and NIST resources for the forensic DNA community. / Coble, Michael D.; Kline, Margaret C.; Butler, John M.

In: Accreditation and Quality Assurance, Vol. 16, No. 6, 01.06.2011, p. 293-297.

Research output: Contribution to journalReview article

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